TSUJI Kouichi

  • Department:Graduate School of Engineering Applied Chemistry and Bioengineering (Applied Chemistry and Bioengineering) Position:Professor
Last Updated:2017/03/27

Career

Educational Background

  • Tohoku University Graduate School, Division of Engineering Doctor Course

Academic Awards

  • 2013
  • 2013
  • 2013
  • 2013
  • 2012
  • 2010
  • 2007
  • 2005 Best Poster Award at Denver X-ray Conference 2005
  • 2005 CSI Poster Award 2005
  • 2003 TXRF2003 Best Poster Award
  • 2002 Young Scientist Researcher Award at EDXRS 2002
  • 2002 The Best Poster Award at EDXRS 2002
  • 2002 The Wiley Best Poster Award of ART2002
  • 1997
  • 1997
  • 1996
  • 1995

Current Research Subjects

Current Research Subjects

  • Research Subject:micro-trace analysis using electrons and x-rays
    Research Field:Industrial Analytical Chemistry、Surface Physics、Separation, Refining and Identification
    Keywords:total reflection XRF、3 dimensional elementanalysis、environmental analysis
  • Research Subject:Spectroscopic analysis of glow discharge plasmas
    Research Field:Industrial Analytical Chemistry、Industrial Physical Chemistry
    Keywords:glow discharge、plasma process、optical emission spectroscopy
  • Research Subject:Analytical applications of scanning probe microscope
    Research Field:Surface Physics、Industrial Analytical Chemistry
    Keywords:scanning probe microscope、micro analysis、surface science

Research Achievements

Books・Papers

  • Micro-X-ray Fluorescence
    Type:Book
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:Encyclopedia of Analytical Chemistry, eds. R.A. Meyers, John Wiley: Chichester
    Volume/Number,Page::00-00
    Authors:K. Tsuji
  • Visualizing a black cat drawing hidden inside the painting by confocal micro-XRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2016/00
    Name of Publisher/Name of Journal:Microchemical Journal
    Volume/Number,Page:126:496-500
    Authors:Kazuhiko Nakano, Atsushi Tabe, Susumu Shimoyama, Kouichi Tsuji
  • Study of metal release from stainless steels in simulated food contact by means of total reflection X-ray fluorescence
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2016/00
    Name of Publisher/Name of Journal:Journal of Food Engineering
    Volume/Number,Page:173:85-91
    Authors:R. Dalipi, L. Borgese, A. Casaroli, M. Boniardi, U. Fittschen, K. Tsuji, L.E. Depero
  • New developments of X-ray fluorescence imaging techniques in laboratory
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Spectrochim. Acta Part B
    Volume/Number,Page:113:45-53
    Authors:K.Tsuji, T.Matsuno, Y.Takimoto, M.Yamanashi, N.Kometani, Y.C.Sasaki, T.Hasegawa, S.Kato, T.Yamada, T.Shoji, N.Kawahara
  • Secondary excitation process for quantitative confocal 3D-XRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Powder Diffraction
    Volume/Number,Page:30:109-112
    Authors:Kouichi Tsuji, Atsushi Tabe, Peter Wobrauscheck, Christina Streli
  • 「玩具表面から溶出する微量な重金属のモニター技術」 微量金属分析とその前処理技術 10章8節
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2015/03
    Name of Publisher/Name of Journal:株式会社技術情報協会
    Volume/Number,Page::423-429
  • Preliminary experiment of X-ray diffraction imaging
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Nucl. Instrum. Methods Phys. Res., B
    Volume/Number,Page:355:272-275
    Authors:Masaki Yamanashi, Noritsugu Kometani, and Kouichi Tsuji
  • On X-Ray Channeling in a Vibrating Capillary
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Nucl. Instrum. Methods Phys. Res., B
    Volume/Number,Page:355:289-292
    Authors:A. Liedl, S.B. Dabagov, D. Hampai, C. Polese, and K. Tsuji
  • 共焦点型蛍光X線分析法による置換めっきプロセスのモニタリング
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/03
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:46:269-276
    Authors:北戸 雄大、平野 新太郎、米谷 紀嗣、 辻 幸一、
  • Confocal micro-XRF analysis of light elements with Rh X-ray tube and its application for painted steel sheet
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:44:186-189
    Authors:Ryota Yagi and Kouichi Tsuji
Display all
Books・Papersclose
  • Micro-X-ray Fluorescence
    Type:Book
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:Encyclopedia of Analytical Chemistry, eds. R.A. Meyers, John Wiley: Chichester
    Volume/Number,Page::00-00
    Authors:K. Tsuji
  • Visualizing a black cat drawing hidden inside the painting by confocal micro-XRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2016/00
    Name of Publisher/Name of Journal:Microchemical Journal
    Volume/Number,Page:126:496-500
    Authors:Kazuhiko Nakano, Atsushi Tabe, Susumu Shimoyama, Kouichi Tsuji
  • Study of metal release from stainless steels in simulated food contact by means of total reflection X-ray fluorescence
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2016/00
    Name of Publisher/Name of Journal:Journal of Food Engineering
    Volume/Number,Page:173:85-91
    Authors:R. Dalipi, L. Borgese, A. Casaroli, M. Boniardi, U. Fittschen, K. Tsuji, L.E. Depero
  • New developments of X-ray fluorescence imaging techniques in laboratory
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Spectrochim. Acta Part B
    Volume/Number,Page:113:45-53
    Authors:K.Tsuji, T.Matsuno, Y.Takimoto, M.Yamanashi, N.Kometani, Y.C.Sasaki, T.Hasegawa, S.Kato, T.Yamada, T.Shoji, N.Kawahara
  • Secondary excitation process for quantitative confocal 3D-XRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Powder Diffraction
    Volume/Number,Page:30:109-112
    Authors:Kouichi Tsuji, Atsushi Tabe, Peter Wobrauscheck, Christina Streli
  • 「玩具表面から溶出する微量な重金属のモニター技術」 微量金属分析とその前処理技術 10章8節
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2015/03
    Name of Publisher/Name of Journal:株式会社技術情報協会
    Volume/Number,Page::423-429
  • Preliminary experiment of X-ray diffraction imaging
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Nucl. Instrum. Methods Phys. Res., B
    Volume/Number,Page:355:272-275
    Authors:Masaki Yamanashi, Noritsugu Kometani, and Kouichi Tsuji
  • On X-Ray Channeling in a Vibrating Capillary
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Nucl. Instrum. Methods Phys. Res., B
    Volume/Number,Page:355:289-292
    Authors:A. Liedl, S.B. Dabagov, D. Hampai, C. Polese, and K. Tsuji
  • 共焦点型蛍光X線分析法による置換めっきプロセスのモニタリング
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/03
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:46:269-276
    Authors:北戸 雄大、平野 新太郎、米谷 紀嗣、 辻 幸一、
  • Confocal micro-XRF analysis of light elements with Rh X-ray tube and its application for painted steel sheet
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:44:186-189
    Authors:Ryota Yagi and Kouichi Tsuji
  • Secondary Excitation Process for Quantitative Confocal 3D-XRF Analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2015/00
    Name of Publisher/Name of Journal:Advances in X-ray Analysis
    Volume/Number,Page:58:191-199
    Authors:Kouichi Tsuji, Atsushi Tabe, Peter Wobrauscheck, Christina Streli
  • Development of a compact grazing exit X-ray fluorescence spectrometer for fast trace elemental analysis
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2014/11
    Name of Publisher/Name of Journal:Spectrochimica Acta Part B
    Volume/Number,Page:101:200-203
  • First Total Reflection X-Ray Fluorescence round-robin test of water samples: Preliminary results
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/11
    Name of Publisher/Name of Journal:Spectrochimica Acta Part B
    Volume/Number,Page:101:6-14
    Authors:Laura Borgese, Fabjola Bilo, Kouichi Tsuji, et. al.
  • Underfilm corrosion of steel sheets observed by confocal 3D-XRF technique
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/06
    Name of Publisher/Name of Journal:Powder Diffraction.
    Volume/Number,Page:29(2):151-154
    Authors:K. Akioka, T. Nakazawa, T. Doi, M. Arai, and K. Tsuji
  • 微小部蛍光X線分析法を用いた都市河川大和川における天然アユ遡上数の推定
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/00
    Name of Publisher/Name of Journal:環境アセスメント学会誌
    Volume/Number,Page:12(1):101-108
    Authors:浪田 真由、恩地 啓実、板谷 天馬、中澤 隆、辻 幸一、矢持 進
  • Elemental depth imaging of solutions for monitoring corrosion process of steel sheet by confocal micro-XRF
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/07
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:43(4):216-220
    Authors:S. Hirano, K. Akioka, T. Doi, M. Arai, and K. Tsuji
  • Comparison of two confocal micro-XRF spectrometers with different design aspects
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/03
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:43:93-101
    Authors:S. Smolek, T. Nakazawa, A. Tabe, K. Nakano, K. Tsuji, C. Streli, and P. Wobrauschek
  • 3次元蛍光X線分析法による鉄鋼試料表面近傍の元素分布の可視化
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/07
    Name of Publisher/Name of Journal:鉄と鋼
    Volume/Number,Page:100(7):897-904
    Authors:辻 幸一、平野 新太郎、八木 良太、中澤 隆、秋岡 幸司、土井 教史
  • 第49 回X 線分析討論会および第15 回全反射蛍光X 線分析法(TXRF2013)国際会議合同会議報告
    Type:会議報告
    by Single Author or Co-authored:Single Author
    Date of Publication:2014/03
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:45:349-357
  • 第62 回デンバーX 線会議報告
    Type:会議報告
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/03
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:45:341-344
    Authors:秋岡 幸司、辻 幸一
  • 共焦点型3 次元蛍光X 線分析法によるリチウムイオン二次電池の電極材料分析
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/03
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:45:241-250
    Authors:八木 良太、平野 新太郎、辻 幸一、Mareike Falk、Jurgen Janek、Ursula Fittschen
  • ストレートポリキャピラリーと二次元検出器を備えた波長分散型蛍光X 線イメージング装置の開発と特性評価
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2014/03
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:45:129-138
    Authors:江本 精二、辻 幸一、加藤 秀一、山田 隆、庄司 孝
  • Fundamental Characteristics of Hybrid X-ray Focusing Optics for Micro X-ray Fluorescence Analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2013
    Name of Publisher/Name of Journal:Nucl. Instrum. Methods Phys. Res., Sect. B
    Volume/Number,Page:309:260-263
    Authors:S. Komatani, K. Nakamachi, K. Nakano, S. Ohzawa, H. Uchihara, A. Bando, and K. Tsuji
  • Elemental depth profiling of forensic samples by confocal 3D-XRF method
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2013
    Name of Publisher/Name of Journal:Advances in X-ray Analysis
    Volume/Number,Page:55:217-224
    Authors:S. Emoto, K. Otsuki, K. Nakano, and K. Tsuji
  • Micro X-ray Beam Produced with a Single Glass Capillary for XRF Analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2013
    Name of Publisher/Name of Journal:Advances in X-ray Analysis
    Volume/Number,Page:55:225-233
    Authors:S. Komatani, S. Hirano, T. Aoyama, Y. Yokota, H. Ueda, and K. Tsuji
  • Depth-selective elemental imaging of microSD card by confocal micro-XRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2013
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:42:123-127
    Authors:T. Nakazawa and K. Tsuji
  • Development of a high resolution confocal micro-XRF instrument equipped with a vacuum chamber
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2013/09
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:42:374-379
    Authors:T. Nakazawa and K. Tsuji,
  • X-Ray Elemental Imaging in Depth by Combination of FE-SEM-EDS and Glow Discharge Sputtering
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2013/00
    Name of Publisher/Name of Journal:ISIJ International
    Volume/Number,Page:53:1939-1942
    Authors:F. Onoue and K. Tsuji
  • X-ray Spectrometry (Review Article)
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2012/01
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:84:636-668
    Authors:K. Tsuji, K. Nakano, Y. Takahashi, K. Hayashi, C.-U. Ro
  • Micro-X-ray Fluorescence
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2011/02
    Name of Publisher/Name of Journal:Encyclopedia of Analytical Chemistry, Supplementary vol. S1-S3, eds. R.A. Meyers, John Wiley&Sons, Ltd. Chichester, UK.
    Volume/Number,Page::1949-1972
  • Development of a new confocal 3D-XRF instrument with an X-ray tube
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2011/02
    Name of Publisher/Name of Journal:J. Anal. At. Spectrom.
    Volume/Number,Page:26:305-309
    Authors:K. Tsuji, K. Nakano,
  • Depth Elemental Imaging of Forensic Samples by Confocal micro-XRF Method
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2011/03
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:83:3477-3483
    Authors:K. Nakano, C. Nishi, K. Otsuki, Y. Nishiwaki, K. Tsuji
  • Enhancement of XRF intensity by using Au coated glass-capillary
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2011/08
    Name of Publisher/Name of Journal:Advances in X-ray Analysis
    Volume/Number,Page:54:238-246
    Authors:T. Nakazawa, K. Nakano, M.Yoshida, K. Tsuji
  • Enhancement of XRF intensity by using Au-coated glass monocapillary
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2011/06
    Name of Publisher/Name of Journal:Powder Diffraction
    Volume/Number,Page:26:163-167
    Authors:T. Nakazawa, K. Nakano, M. Yoshida, K. Tsuji
  • 蛍光X線分析法による表面界面元素分析(総説記事)
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2011/11
    Name of Publisher/Name of Journal:日本接着学会誌
    Volume/Number,Page:47:444-452
  • Wavelength Dispersive X-ray Fluorescence Imaging
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2011/07
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:83:6389-6394
    Authors:Tsuji, T. Ohmori, M. Yamaguchi
  • 固体試料の内部を探る世界最高レベルの3次元蛍光X線分析法の開発
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2011/07
    Name of Publisher/Name of Journal:「共創・協奏 -産学連携成功のキーワード-」独立行政法人科学技術振興機構JSTイノベーションプラザ大阪編、丸善
    Volume/Number,Page::271-282
  • 微小部蛍光X線分析と元素イメージング(進歩総説)
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2011/11
    Name of Publisher/Name of Journal:ぶんせき
    Volume/Number,Page:11:654-661
    Authors:中澤 隆、中野 和彦、辻 幸一
  • 分析化学用語辞典(X線関連の用語解説を分担執筆)
    Type:Book
    by Single Author or Co-authored:Others
    Date of Publication:2011/10
    Name of Publisher/Name of Journal:オーム社出版局
    Authors:社団法人日本分析化学会編
  • Micro x-ray fluorescence using a pinhole aperture in quasi-contact mode
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:J. Anal. At. Spectrom.
    Volume/Number,Page:17:1405-1407
    Authors:K. Tsuji, F. Delalieux
  • Localized Thin-Film Analysis by Grazing-Exit EPMA (GE-EPMA)
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:Spectrochim. Acta. B
    Volume/Number,Page:57:897-906
    Authors:K. Tsuji, K. Saito, K. Asami, K. Wagatsuma, F. Delalieux, Z. Spolnik
  • Grazing-exit electron probe x-ray microanalysis of ultra-thin films and single particles
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:Anal. Chim. Acta.
    Volume/Number,Page:455:245-252
    Authors:Z. Spolnik, J. Zhang, K. Wagastuma, K. Tsuji
  • Airborne particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-Ray Microanalysis and Energy Dispersive X-Ray Fluorescence Analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:Anal. Sci.
    Volume/Number,Page:18:561-566
    Authors:J. Injuk, J. Osán, R. Van Grieken, K. Tsuji
  • Enhancement of TXRF Intensity by Using a Reflector
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:X-Ray Spectrom
    Volume/Number,Page:31:358-362
    Authors:K. Tsuji, K. Wagatsuma
  • 斜出射X線分析-EPMAとXRFへの応用
    Type:Review
    by Single Author or Co-authored:Single Author
    Date of Publication:2003
    Name of Publisher/Name of Journal:ぶんせき
    Volume/Number,Page:338:83-88
  • 斜出射X線測定とSTMによる局所表面分析
    Type:Commentary
    by Single Author or Co-authored:Single Author
    Date of Publication:2002
    Name of Publisher/Name of Journal:分析化学
    Volume/Number,Page:51:605-612
  • Quantitative analysis of metallic ultra-thin films by grazing-exit electron probe x-ray microanalysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:X-Ray Spectrometry
    Volume/Number,Page:31:178-183
    Authors:Z. Spolnik, K. Tsuji, K. Saito, K. Asami, K. Wagatsuma
  • X-Ray Spectrometry: Recent TechnologicalAdvances
    Type:Book
    by Single Author or Co-authored:Co-authored
    Date of Publication:2004
    Name of Publisher/Name of Journal:John Wiley& Sons, Ltd
    Volume/Number,Page::603
    Authors:K. Tsuji, J. Injuk, R. E. Van Grieken
  • Grazing-Exit X-Ray Spectrometry
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2004
    Name of Publisher/Name of Journal:X-Ray Spectrometry: Recent Technological Advances, John Wiley& Sons, Ltd
    Volume/Number,Page::293-305
  • 全反射蛍光X線分析
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2004
    Name of Publisher/Name of Journal:「新訂版・表面科学の基礎と応用」(エヌ・ティー・エス)
    Volume/Number,Page::709-715
  • 蛍光X線分析
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2004
    Name of Publisher/Name of Journal:「放射光科学入門」(東北大学出版会)
    Volume/Number,Page::274-279
  • 斜出射蛍光X線分析
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2005
    Name of Publisher/Name of Journal:「蛍光X線分析の実際」(朝倉書店)
    Volume/Number,Page::206-207
  • 全反射蛍光X線分析のための血液試料サンプリング方法の検討
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:分析化学
    Volume/Number,Page:54:749-754
    Authors:松岡代志子、細川好則、日野雅之、辻 幸一
  • 全反射蛍光X線分析のためのグロー放電スパッタリングによる試料作製
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:J. Surf. Anal
    Volume/Number,Page:12:303-307
    Authors:中田 宗寛、辻 幸一
  • キノア種子のX線元素マッピングにおける自己吸収の影響の軽減
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:36:267-274
    Authors:江本哲也、小西洋太郎、X. Ding, 辻 幸一
  • Grazing-exit micro x-ray fluorescence analyses for chemical microchip
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:Anal. Sci.
    Volume/Number,Page:21:799-803
    Authors:K. Tsuji, T.Emoto, Y. Nishida, E. Tamaki, Y. Kikutani, A.Hibara, T. Kitamori
  • 蛍光X線分析における近年の要素技術の進歩と特殊な測定方法
    Type:Commentary
    by Single Author or Co-authored:Single Author
    Date of Publication:2005
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:36:63-74
  • Micro-XRF Instrument Developed in Combination with Atomic Force Microscope
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:Advances in X-Ray Analysis.
    Volume/Number,Page:48:221-228
    Authors:K. Tsuji, T. Emoto, Y. Matsuoka, Y. Miyatake, T. Nagamura, and X. Ding
  • Micro X-ray Fluorescence Analysis at OCU
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:Physics Testing and Chemical Analysis, Part B Chemical Analysis
    Volume/Number,Page:141:20
    Authors:K. Tsuji,K. Nakano, X. Ding
  • Application of X-ray fluorescence analysis for chemical microchips
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:Proceedings of micro-TAS 2005 conference
    Volume/Number,Page:2:991-993
    Authors:K. Tsuji, T. Emoto, Y. Nishida, K. Tsutsumimoto, K. Nakano, E. Tamaki, Y. Kikutani, A. Hibara, T. Ki
  • Characterization of X-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2004
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:33:281-284
    Authors:K. Tsuji, F. Delalieux
  • 反射板を利用した全反射蛍光X線分析の基礎検討
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2004
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:35:193-200
  • Calculation of electron-induced x-ray intensities under grazing-exit conditions
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2003
    Name of Publisher/Name of Journal:e-Journal of. Surface and Nanotechnology
    Volume/Number,Page:1:111-115
    Authors:K. Tsuji, K. Tetsuoka, F. Delalieux, S. Sato
  • Grazing-exit electron probe x-ray microanalysis of light elements
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2004
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:33:16-20
    Authors:Z. Spolnik, K. Tsuji, R. Van Grieken
  • Feasibility study of 3 dimensional XRF spectrometry using micro-x-ray beam under grazing-exit conditions
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2003
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:58:2233-2238
    Authors:K. Tsuji and F. Delalieux
  • Development and applications of a grazing exit micro x-ray fluorescence (GE-micro-XRF) instrument using a polycapillary x-ray lens
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2004
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:59:1291-1294
    Authors:T. Emoto, Y. Sato, Y. Konishi, X. Ding, K. Tsuji
  • X線マイクロビームを用いるナノメーターレベルでの深さ方向分析
    by Single Author or Co-authored:Co-authored
    Date of Publication:2003
    Name of Publisher/Name of Journal:文部科学省 ナノテクノロジー総合支援プロジェクト Spring-8 研究成果報告書
    Volume/Number,Page:2003A(2):151-152
    Authors:辻 幸一、早川 慎二郎、張 利広、山根 一真、米谷 紀嗣、米澤 義朗
  • 斜出射X線測定型-微小部蛍光X線分析装置の開発
    by Single Author or Co-authored:Single Author
    Date of Publication:2003
    Name of Publisher/Name of Journal:大阪市立大学ナノサイエンス・ナノテクノロジーフォーラム報告書
    Volume/Number,Page:2:47-48
  • 微小部X線分析 -TXRF2003サテライト会議での話題を中心に-
    by Single Author or Co-authored:Co-authored
    Date of Publication:2004
    Name of Publisher/Name of Journal:理学電機ジャーナル
    Volume/Number,Page:35:13-17
    Authors:辻 幸一、早川 慎二郎
  • Fundamental Research of Grazing-Exit PIXE
    by Single Author or Co-authored:Co-authored
    Date of Publication:2004
    Name of Publisher/Name of Journal:Japan Atomic Energy Research Institute, TIARA annual report
    Volume/Number,Page:2004(25):272-273
    Authors:K. Tsuji, T. Sakai, S. Yamamoto
  • 斜出射配置における電子線プローブマイクロアナリシス
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2004
    Name of Publisher/Name of Journal:日本電子NEWS
    Volume/Number,Page:36:16-19
  • Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2004
    Name of Publisher/Name of Journal:JEOL NEWS
    Volume/Number,Page:39:52-55
  • Micro-Trace X-ray Analysis - Development of Grazing-Exit-Micro X-Ray Fluorescence (GE-micro-XRF) in Combination with Atomic Force Microscope (AFM)-
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2004
    Name of Publisher/Name of Journal:The proceedings of the 12th Osaka City University, International Symposium
    Volume/Number,Page:2004:137-142
  • 分析電子顕微鏡
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2005
    Name of Publisher/Name of Journal:「機器分析の事典」(朝倉書店)
    Volume/Number,Page::239-241
  • 蛍光X線法
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2007
    Name of Publisher/Name of Journal:表面物性工学ハンドブック第2版(丸善)
    Volume/Number,Page::184-188
  • Grazing-exit electron probe x-ray microanalysis (GE-EPMA): Fundamental and applications (Review article)
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2005
    Name of Publisher/Name of Journal:Spectrochim. Acta, B
    Volume/Number,Page:60:1381-3191
  • リング状グロー放電X線管の試作
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:大阪市立大学工作技術センターレポート"Fabrica"
    Volume/Number,Page:(18):21-26
    Authors:辻 慎一郎、廣瀬 由紀子、辻 幸一
  • 蛍光X線測定による非破壊的な深さ方向元素分析
    Type:Commentary
    by Single Author or Co-authored:Single Author
    Date of Publication:2006
    Name of Publisher/Name of Journal:放射線と産業
    Volume/Number,Page:(112):14-19
  • Development of a New TXRFInstrument using Polycapillary X-ray Lens
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:(112):14-19
    Authors:K. Nakano, K. Tanaka, X. Ding, K. Tsuji
  • Time-Resolved μ-XRF and Elemental Mapping of Biological Materials
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:Advances in X-ray Analysis
    Volume/Number,Page:49:296-301
    Authors:K.Tsuji, K.Tsutsumimoto, K.Nakano, K.tanaka, A.Okhrimovskyy, Y.Konishi, and X.Ding
  • Development Plastic Certified Reference Material for XRF analysis (JSAC)containing Pb,Cd,Cr;Part1.Sample Preparation and Homogeneitytest
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:Advances in X-ray Analysis
    Volume/Number,Page:49:375-378
    Authors:K. Nakano, K. Tsuji, M. Kozaki, K. Kakita, A. Ono, T. Nakamura
  • Micro Total Reflection X-ray Fluorescence (Micro-TXRF) Analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:X-ray Spectrometry
    Volume/Number,Page:35:375-378
    Authors:K. Tsuji, M. Kawamata, Y. Nishida, K. Nakano, K. Sasaki
  • Investigation of Experimental Arrangements in X-ray Fluorescence Analysis Using Ultra-Thin Sample Carrier
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:Memoirs of the Faculty of Engineering Osaka City University
    Volume/Number,Page:47:21-24
    Authors:Andriy Okhrimovskyy, T. Moriyama, K. Tsuji
  • Theoretical characterization of reflector-assisted TXRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:e-Journal of. Surface Science and Nanotechnology
    Volume/Number,Page:4:579-583
    Authors:Andriy Okhrimovskyy, K. Saito, K. Tsuji
  • ニードル型コリメーターを用いた試料内部微小空間の蛍光X線分析
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:分析化学
    Volume/Number,Page:55:681-687
    Authors:松田晃典、辻 幸一
  • 共焦点型蛍光X線分析装置の開発と米試料の三次元分析
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:分析化学
    Volume/Number,Page:55:427-432
    Authors:中野 和彦, 辻 幸一
  • ポリキャピラリーX線レンズの基礎と応用
    Type:Commentary
    by Single Author or Co-authored:Single Author
    Date of Publication:2006
    Name of Publisher/Name of Journal:ぶんせき
    Volume/Number,Page:(8):378-382
  • Numerical approach for depthprofiling with GE-XRF
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:35:305-311
    Authors:Andriy Okhrimovskyy, K. Tsuji
  • Total reflection X-ray fluorescence analysis with chemical microchip
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:61:389-392
    Authors:K. Tsuji, Y. Hanaoka, A. Hibara, M. Tokeshi, T. Kitamori
  • X-ray fluorescence analysis of soft materials using needle-type collimators enabling greater tolerance in analysis depth
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:61:460-464
    Authors:K. Tsuji, A. Matsuda, K. Nakano, A. Okhrimovskyy
  • Improvement of reproducibility in grazing-exit EPMA (GE-EPMA)
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:35:89-92
    Authors:T. Tetsuoka, T. Nagamura,K. Tsuji
  • 2005年X線分析関連文献総合報告
    Type:Commentary
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:X線分析の進歩,
    Volume/Number,Page:37:25-44
    Authors:河合潤、桜井健次、辻幸一、林久史、松尾修司、森良弘他
  • ポリキャピラリーX線レンズの特性評価
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:37:289-300
    Authors:田中 啓太、堤本 薫、荒井 正浩、辻 幸一
  • Time-resolved X-ray fluorescence for monitoring the intake of mineral nutrients in living plants
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:36:324-327
    Authors:K. Tsutsumimoto, K. Tsuji
  • 共焦点型3次元蛍光X線分析装置の開発と微小部深さ方向分析への応用
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:表面科学
    Volume/Number,Page:28:447-452
    Authors:辻 幸一、野寺 雄太、中野 和彦
  • 境界領域から生まれる融合的な分析科学
    Type:Commentary
    by Single Author or Co-authored:Single Author
    Date of Publication:2007
    Name of Publisher/Name of Journal:ぶんせき(ロータリー、談話室)
    Volume/Number,Page:5:255
  • 合金シードを用いためっきCu薄膜のキャラクタリゼーション
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:分析化学、
    Volume/Number,Page:56:465-470
    Authors:廣瀬幸範、本田和仁、前川和義、宮崎博史、辻幸一他
  • 固液界面用蛍光X線分析法の提案と化学めっき過程の観察
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:分析化学
    Volume/Number,Page:56:499-504
    Authors:堤本 薫, 辻 幸一
  • Development of Confocal 3D micro XRF Spectrometer with Cr-Mo Dual Excitation
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:36:145-149
    Authors:K. Tsuji, K. Nakano
  • Development of Confocal Micro-XRF Instrument using Two X-ray Beams
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:62:549-553
    Authors:K. Tsuji, K. Nakano, X. Ding
  • X-ray Technology
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2007
    Name of Publisher/Name of Journal:Kirk-Othmer Encyclopedia of Chemical Technology, 5th ed.,ed. A. Seidel, John Wiley& Sons
    Volume/Number,Page:26:411-444
  • 2006年X線分析関連文献総合報告
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:38:67-88
    Authors:桜井健次、辻幸一、中野和彦、林久史、松尾修司他
  • プラスチック試料からの溶出液中金属元素の全反射蛍光X線分析法
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:41:185-193
    Authors:川又 誠也, 今西 由紀子, 中野 和彦, 辻 幸一
  • Development of Laboratory Confocal 3D-XRF Spectrometer and Nondestructive Depth Profiling
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:J. Anal. At. Spectrom.
    Volume/Number,Page:25:562-569
    Authors:K. Nakano, K. Tsuji
  • Development of a transportable μ-XRF spectrometer with polycapillary half lens
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:39:78-82
    Authors:T. Yonehara, D. Orita, K. Nakano,S. Komatani, S. Ohzawa, A. Bando, H. Uchihara, K. Tsuji
  • X-ray fluorescence imaging with polycapillary X-ray optics
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:Spectrochim. Acta Part B
    Volume/Number,Page:65:441-444
    Authors:T. Yonehara, M. Yamaguchi, K. Tsuji
  • X-ray Spectrometry
    Type:Review
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:82:4950-4987
    Authors:K. Tsuji, K. Nakano, Y. Takahashi, K. Hayashi, C.-U. Ro
  • 走査型共焦点蛍光X線分析法による試料表面および表面近傍の三次元元素分析
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:表面科学
    Volume/Number,Page:31:331-336
    Authors:中野 和彦, 辻 幸一
  • Nondestructive elemental depth profiling of Japanese lacquerware Tamamushi-nuri by confocal 3D-XRF analysis in comparison with micro GE-XRF
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2009
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:38:446-450
  • Effects of an X-ray absorber in grazing exit micro x-ray fluorescence analysis of arsenic attached to anaqueous leaf of Cammelia hiemalis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2009
    Name of Publisher/Name of Journal:e-Journal of Surface Science and Nanotechnology
    Volume/Number,Page:7:841-846
    Authors:T. Awane, K. Nakamachi, K. Tsuji,
  • Amicrox-ray fluorescence analysis method using polycapillary x-ray optics and grazing exit geometry
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2009
    Name of Publisher/Name of Journal:Thin Solid Films
    Volume/Number,Page:517:3357-3361
    Authors:J. Yang, K. Tsuji, X. Lin, D. Han, X. Ding,
  • 血液中金属元素の全反射蛍光X線分析
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2009
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:40:249-257
    Authors:中村 卓也, 松井 宏, 川又 誠也, 中野 和彦, 片山 貴子, 日野 雅之, 鰐渕 英機, 荒波 一史, 山田 隆, 辻 幸一
  • Grazing Exit Micro X-ray Fluorescence Analysis of Hazardous Metal Attached to a Plant Leaf Surface Using an X-ray Absorber Method
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2009
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:81:3356-3364
    Authors:T. Awane, S.Fukuoka, K. Nakamachi, K. Tsuji
  • Fundamental characteristics of polycapillary x-ray optics combined with glass conical pinhole for micro x-ray fluorescence spectrometry
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2009
    Name of Publisher/Name of Journal:X-Ray Spectrom
    Volume/Number,Page:38:258-262
    Authors:A. Matsuda, K. Nakano, S. Komatani, S. Ohzawa, H. Uchihara, K. Tsuji
  • Preconcentration of environmental waters by agar for XRF analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2009
    Name of Publisher/Name of Journal:Powder Diffraction
    Volume/Number,Page:24:135-139
    Authors:K. Nakano, K. Okubo, K. Tsuji
  • X線発光分光
    Type:Paper
    by Single Author or Co-authored:Single Author
    Date of Publication:2008
    Name of Publisher/Name of Journal:分光研究
    Volume/Number,Page:57:29-41
  • Application of confocal 3D micro XRF for solid/liquid interface analysis,
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:Anal. Sci.
    Volume/Number,Page:24:99-103
    Authors:K. Tsuji, T. Yonehara, K. Nakano
  • X-ray Energy Dependence of the Properties of the Focused Beams Produced by Polycapillary X-ray Lens
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:Anal.Sci.
    Volume/Number,Page:24:843-846
    Authors:A. Matsuda, Y. Nodera, K. Nakano, K. Tsuji
  • 粘着性テープを用いた蛍光X線分析用簡易サンプリング方法
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:39:179-187
    Authors:西田 洋介, 辻 幸一
  • X-Ray Spectrometry
    Type:Review
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:80:4421-4454
    Authors:K. Tsuji, K. Nakano, H. Hayashi, C. U. Ro,
  • 照射・検出同軸型の微小部XRFプローブの開発
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:39:95-104
    Authors:米原 翼, 辻 幸一
  • 2007年X線分析関連文献総合報告
    Type:Review
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:39:27-46
    Authors:石井 真史、栗崎 敏、高山 透、辻 幸一、沼子 千弥、林 久史、前尾 修司、松尾 修司、村松康司、森 良弘、横溝 臣智、渡部 孝
  • Development of a compact XRF probe using a ring-type secondary target
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:37:503-507
    Authors:T. Yonehara, K.Tsuji
  • Milling characteristics and distribution of phytic acid and zinc in rice kernels
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:Journal of Cereal Science
    Volume/Number,Page:48:83-91
    Authors:J. Liang, Z. Li, K. Tsuji, K. Nakano, M. J. R. Nout, R. J. Hamer
  • Micro and imaging x-ray analysis by using polycapillary x-ray optics
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:Proc. SPIE
    Volume/Number,Page:7077:70770W-1-8
    Authors:K. Tsuji, K. Nakano, M. Yamaguchi, T. Yonehara
  • Improvement of spatial resolution of μ-XRF by using a thin metal filter
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:37:642-645
    Authors:K.Nakano, A. Matsuda, Y. Nodera, and K. Tsuji,
  • GE-MXRF analysis of multilayer films
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:X-Ray Spectrom.
    Volume/Number,Page:37:625-628
    Authors:J. Yang, K. Tsuji, D. Han, and X. Ding
  • 実験室における微小部蛍光X線分析の利用
    Type:Book
    by Single Author or Co-authored:Single Author
    Date of Publication:2008
    Name of Publisher/Name of Journal:「ナノイメージング」、エヌ・テイー・エス
    Volume/Number,Page::305-320
  • 共焦点三次元蛍光X線分析
    Type:Book
    by Single Author or Co-authored:Co-authored
    Date of Publication:2008
    Name of Publisher/Name of Journal:「ナノイメージング」、エヌ・テイー・エス
    Volume/Number,Page::450-457
    Authors:中野 和彦、辻 幸一
  • 全反射現象を利用した蛍光X線表面分析法
    Type:Book
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:「材料工学の先端実験技術」日本金属学会
    Volume/Number,Page::111-116
    Authors:辻 幸一, 広川 吉之助
  • 斜出射X線測定型の電子線プローブマイクロアナリシス
    Type:Review
    by Single Author or Co-authored:Single Author
    Date of Publication:2001
    Name of Publisher/Name of Journal:X線分析の進歩(アグネ技術センター)
    Volume/Number,Page:32:25-44
  • 斜出射X線測定による微小領域の表面分析と微粒子分析
    Type:Review
    by Single Author or Co-authored:Single Author
    Date of Publication:2000
    Name of Publisher/Name of Journal:まてりあ(最近の研究)
    Volume/Number,Page:39:586-593
  • Surface Studies by Grazing-Exit Electron Probe Microanalysis(GE-EPMA),
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2001
    Name of Publisher/Name of Journal:X-Ray Spectrometry, 30, 123-126 (2001).
    Volume/Number,Page:30:123-126
    Authors:K. Tsuji, Y. Murakami, K. Wagatsuma, G. Love
  • Grazing-Exit X-Ray Spectrometry for Surface and Thin-Film Analyses,
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2001
    Name of Publisher/Name of Journal:Anal. Sci.
    Volume/Number,Page:17:145-148
    Authors:K. Tsuji, Z. Spolnik, K. Wagatsuma, S. Nagata, I. Satoh,
  • New experimental equipment for grazing-exit electron probe microanalysis (GE-EPMA)
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2001
    Name of Publisher/Name of Journal:Rev. Sci. Instrum.
    Volume/Number,Page:72:3933-3936
    Authors:K. Tsuji, Z. Spolnik, and T. Ashino
  • Continuous x-ray background in grazing-exit electron probe x-ray microanalysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2001
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:56:2497-2504
    Authors:K. Tsuji, Z. Spolnik, K. Wagatsuma
  • 斜出射条件下でのEPMA
    by Single Author or Co-authored:Single Author
    Date of Publication:2001
    Name of Publisher/Name of Journal:日本学術振興会製鋼第19委員会 製鋼計測化学研究会 予稿、19委-11935
    Volume/Number,Page::1-19
  • X線分析関連の3つの国際会議報告
    by Single Author or Co-authored:Single Author
    Date of Publication:2002
    Name of Publisher/Name of Journal:ぶんせき
    Volume/Number,Page:2002:533
  • 斜出射EPMA装置の試作と分析性能の評価
    by Single Author or Co-authored:Single Author
    Date of Publication:2002
    Name of Publisher/Name of Journal:島津科学技術振興財団平成11年度最終報告書 (Annual Report of Shimadzu Science Foundation)
    Volume/Number,Page::28-32
  • Glancing-Incidence and Glancing-Takeoff X-Ray Fluorescence Analysis of Ni-GaAs Interface-Reactions
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2000
    Name of Publisher/Name of Journal:X-Ray Spectrometry
    Volume/Number,Page:29:155-160
    Authors:K. Tsuji, K. Wagatsuma and T. Oku,
  • X-ray source combined ultrahigh-vacuum scanning tunneling microscopy for elemental analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2000
    Name of Publisher/Name of Journal:J. Vac. Sci. Tech. B.
    Volume/Number,Page:18:2676-2680
    Authors:Y. Hasegawa, K. Tsuji, K. Nakayama, K. Wagatsuma, T. Sakurai
  • Comparison of grazing-exit particle-induced X-ray emission with other related methods
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2000
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:55:1009-1016
    Authors:K. Tsuji, M. Huisman, Z. Spolnik, K. Wagatsuma, Y. Mori, R. E. Van Grieken,R. D. Vis,
  • 斜出射EPMA装置の試作と分析性能の評価
    by Single Author or Co-authored:Single Author
    Date of Publication:2000
    Name of Publisher/Name of Journal:島津科学技術振興財団平成11年度事業報告書(Annual Report of Shimadzu Science Foundation
    Volume/Number,Page::19
  • 元素の識別 -X線照射による元素分析型STMの試み-
    Type:Review
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Boundary
    Volume/Number,Page:1999(8):10-13
    Authors:辻 幸一、我妻 和明、杉山 和正、長谷川 幸雄
  • Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Rev. Sci. Instrum.
    Volume/Number,Page:70:1621-1623
    Authors:K. Tsuji, T. Sato, K. Wagatsuma, M. Claes, and R. Van Grieken
  • Enhancement of X-ray fluorescence intensity from ultra-thin Ni layer sandwiched with carbon layers at grazing-emission angles
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:54:1881-1888
    Authors:K. Tsuji, H. Takenaka, K. Wagatsuma, P. K. de Bokx and R. E. Van Grieken
  • EXAFS- and XANES-like spectra obtained by x-ray excited scanning tunneling microscope tip current measurement
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Surf. Interface Anal.
    Volume/Number,Page:27:132-135
    Authors:K. Tsuji, K. Wagatsuma, K. Sugiyama, K. Hiraga, Y. Waseda
  • Grazing-exit electron probe microanalysis for surface and particle analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:71:2497-2501
    Authors:K. Tsuji, K.Wagatsuma, R. Nullens, and R. Van Grieken
  • Enhancement of electron-induced X-ray intensity for single particles under grazing-exit conditions
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Spectrochim. Acta B.
    Volume/Number,Page:54:1243-1251
    Authors:K. Tsuji, Z. Spolnik,K. Wagatsuma, J. Zhang, and R. Van Grieken
  • Grazing-exit particle-induced X-ray emission analysis with extremely low background
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Anal. Chem.
    Volume/Number,Page:71:5033-5036
    Authors:K. Tsuji, Z. Spolnik, K. Wagatsuma, R. E. Van Grieken, R. D. Vis
  • Elemental X-ray images obtained by grazing-exit electron probe microanalysis(GE-EPMA)
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:J. Anal. At. Spectrom.
    Volume/Number,Page:14:1711-1713
    Authors:K. Tsuji, K. Wagatsuma, R. Nullens, and R. Van Grieken
  • 1st Workshop on Environmental AnalyticalArtefacts
    by Single Author or Co-authored:Single Author
    Date of Publication:1999
    Name of Publisher/Name of Journal:ぶんせき
    Volume/Number,Page:1999:435
  • EMAS'99 European Workshop
    by Single Author or Co-authored:Single Author
    Date of Publication:1999
    Name of Publisher/Name of Journal:表面科学
    Volume/Number,Page:20:495
  • ベルギーのマイクロアナリシス研究集団
    by Single Author or Co-authored:Single Author
    Date of Publication:1999
    Name of Publisher/Name of Journal:まてりあ
    Volume/Number,Page:38:652
  • Preliminary experiments on grazing-exit electron probe microanalysis (GE-EPMA)
    by Single Author or Co-authored:Co-authored
    Date of Publication:1999
    Name of Publisher/Name of Journal:Electron Microscopy and Analysis 1999, proceedings of EMAG conference
    Volume/Number,Page:161:119-122
    Authors:K. Tsuji, Z. Spolnik, K. Wagatsuma, R. Nullens, and R. Van Grieken
  • X-ray fluorescence analysis by multiple-glancing x-ray beam excitation
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:37:5821-5822
    Authors:K. Tsuji, T. Sato and K. Wagatsuma
  • Scanning tunneling microscope tip current excited by modulated x-rays
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:37:2028-2032
    Authors:K. Tsuji, T. Nagamura, and K. Wagatsuma
  • Detection of x-ray induced current using a scanning tunneling microscopeand its spatial mapping for elemental analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:37:L1271-L1273
    Authors:K. Tsuji, Y. Hasegawa, K. Wagatsuma and T. Sakurai
  • 高電圧グロー放電からのX線放射
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:29:223-232
    Authors:辻 幸一, 松田 秀幸, 我妻 和明
  • Grimmglow discharge X-ray tube
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:53:417-426
    Authors:K. Tsuji, T. Sato and K. Wagatsuma
  • X-ray measurement from the cathode surface of glow discharge tube used as a compact x-ray fluorescence instrument
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:53:1669-1677
    Authors:K. Tsuji, K. Wagatsuma, S. Yamaguchi, S. Nagata, and K. Hirokawa,
  • Compact glow discharge x-ray tube
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1998
    Name of Publisher/Name of Journal:Rev. Sci. Instrum.
    Volume/Number,Page:69:4006-4007
    Authors:K. Tsuji and K. Wagatsuma
  • 走査型プローブ顕微鏡による元素識別
    Type:Review
    by Single Author or Co-authored:Single Author
    Date of Publication:1997
    Name of Publisher/Name of Journal:ぶんせき
    Volume/Number,Page:1997:665
  • Takeoff angle-dependent x-ray fluorescence analysis of thin films on acrylicsubstrate
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:Journal of Trace and Microprobe Techniques
    Volume/Number,Page:15:1-11
    Authors:K. Tsuji, K. Wagatsuma and K. Hirokawa
  • Experimental evaluation of the Mo Kα x-ray penetration depth for a GaAs waferin a total reflection x-ray fluorescence analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:Anal. Sci.
    Volume/Number,Page:13:351-354
    Authors:K. Tsuji, K. Wagatsuma and K. Oku
  • Development of the glancing-incidence and -takeoff x-ray fluorescence analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:52:841-846
    Authors:K. Tsuji, K. Wagatsuma, K. Hirokawa, T. Yamada, and T. Utaka
  • 全反射X線侵入深さの評価
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:表面科学
    Volume/Number,Page:18:424-428
    Authors:辻 幸一、我妻 和明
  • X線照射下でのSTM観察と探針電流の測定
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:28:289-300
    Authors:辻 幸一、我妻 和明
  • Optimum gaseous pressure for the measurement of the x-ray excited scanning tunneling microscope tip current
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:36:1264-1267
    Authors:K. Tsuji and K. Wagatsuma
  • Characteristics of total reflection x-ray excited current detected with the tip of scanning tunneling microscope
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:52:855-860
    Authors:K. Tsuji, K. Wagatsuma and K. Hirokawa
  • Fast electrons from Grimm glow discharge helium plasmas
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:36:L446-L448
    Authors:K. Tsuji, H. Matsuta and K. Wagatsuma
  • Characteristics of fast electrons from Grimm glow discharge He plasmas as an electron source
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:Spectrochim. Acta B
    Volume/Number,Page:52:1587-1595
    Authors:K. Tsuji, K. Wagatsuma and H. Matsuta
  • グリム型グロー放電プラズマからの高速電子放出現象とX線元素分析への応用
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1997
    Name of Publisher/Name of Journal:分析化学
    Volume/Number,Page:46:863-867
    Authors:辻 幸一, 我妻 和明, 松田 秀幸
  • 全反射現象を利用した蛍光X線表面分析法
    Type:Review
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:まてりあ (先端実験技術シリーズ)
    Volume/Number,Page:35:1333-1338
    Authors:辻 幸一、広川 吉之助
  • Evaluation of Ni/Mn multilayer samples with glancing-incidence and -takeoff x-ray fluorescence analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Appl. Phys. A
    Volume/Number,Page:62:87-93
    Authors:S. Sato, K. Tsuji, and K. Hirokawa
  • 斜入射・斜出射-蛍光X線分析法による表面反応の評価
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:表面科学
    Volume/Number,Page:17:346-351
    Authors:辻 幸一、広川 吉之助
  • Glancing-incidence and glancing-takeoff x-ray fluorescence analysis of a Mn ultrathin film on an Au layer
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Thin Solid Films
    Volume/Number,Page:274:18-22
    Authors:K. Tsuji, S. Sato, and K. Hirokawa
  • Solid surface density determination using the glancing-takeoff x-ray fluorescence method
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:35:L1535-L1537
    Authors:K. Tsuji and K. Wagatsuma
  • Nondestructive depth profiling of oxidized Fe-Cr alloy by the glancing-incidence and -takeoff x-ray fluorescence method
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Appl. Surf. Sci.
    Volume/Number,Page:103:451-458
    Authors:K. Tsuji and K. Hirokawa
  • Glancing-incidence and takeoff x-ray fluorescence and scanning tunneling microscopy of thin films under x-ray irradiation
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Surf. Interface Anal.
    Volume/Number,Page:24:286-289
    Authors:K. Tsuji and K. Hirokawa
  • STM装置を用いたX線励起電流の測定
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:表面科学
    Volume/Number,Page:17:161-166
    Authors:辻 幸一、広川 吉之助
  • Characteristics of an x-ray-excited current detected with an STM tip
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Rev. Sci. Instrum.
    Volume/Number,Page:67:3573-3577
    Authors:K. Tsuji and K. Hirokawa
  • Nondestructive depth profiling by glancing-incidence and -takeoff x-ray fluorescence
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Mater. Trans. JIM
    Volume/Number,Page:37:295-298
    Authors:K. Tsuji, S. Sato, and K. Hirokawa
  • Surface analysis of Fe-Cr alloy by glancing-incidence and -takeoff x-ray fluorescence method
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1996
    Name of Publisher/Name of Journal:Mater. Trans. JIM
    Volume/Number,Page:37:1033-1036
    Authors:K. Tsuji and K. Hirokawa
  • 斜入射条件下における取り出し角依存-蛍光X線分析法による真空蒸着薄膜および溶液滴下-乾燥薄膜の分析
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1995
    Name of Publisher/Name of Journal:X線分析の進歩
    Volume/Number,Page:26:59-74
    Authors:辻 幸一、水戸瀬賢悟、広川 吉之助
  • The effects of surface roughness on the angle-dependent total-reflection x-ray fluorescence of ultrathin films
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1995
    Name of Publisher/Name of Journal:J. Appl. Phys.
    Volume/Number,Page:78:969-973
    Authors:K. Tsuji, T. Yamada, T. Utaka, and K. Hirokawa
  • Depth profiling using the glancing-incidence and -takeoff x-ray fluorescence method
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1995
    Name of Publisher/Name of Journal:Rev. Sci. Instrum.
    Volume/Number,Page:66:4847-4852
    Authors:K. Tsuji, S. Sato,and K. Hirokawa
  • X-ray excited current detected with scanning tunneling microscope equipment
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1995
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:34:L1506-L1508
    Authors:K. Tsuji and K. Hirokawa
  • X-ray fluorescence analysis of thin films at glancing-incident and -takeoff angles
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1995
    Name of Publisher/Name of Journal:Advances in X-Ray Chemical Analysis, JAPAN
    Volume/Number,Page:26s:151-156
    Authors:K. Tsuji, S. Sato, and K. Hirokawa
  • Takeoff angle-dependentx-ray fluorescence of layered materials using a glancing incident x-ray beam
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1994
    Name of Publisher/Name of Journal:J. Appl. Phys.
    Volume/Number,Page:75:7189-7194
    Authors:K. Tsuji and K. Hirokawa
  • Characterization of Au thin film by Glancing-Incidence and -Takeoff X-Ray Fluorescence Spectroscopy
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1994
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:33:L1277-L1279
    Authors:K. Tsuji, S. Sato, and K. Hirokawa
  • Effect of surface roughness on takeoff-angle-dependent x-ray fluorescence of ultrathin films at glancing incidence
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1994
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:33:6316-6319
    Authors:K. Tsuji, A. Sasaki, and K. Hirokawa
  • Surface-sensitive x-ray fluorescence analysis at glancing incident and takeoff angles
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1994
    Name of Publisher/Name of Journal:J. Appl. Phys.
    Volume/Number,Page:76:7860-7863
    Authors:K. Tsuji, S. Sato, and K. Hirokawa
  • 斜入射・斜出射-蛍光X線分析法による表面・薄膜分析
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1994
    Name of Publisher/Name of Journal:表面科学
    Volume/Number,Page:15:668-674
    Authors:辻 幸一、佐藤 成男、広川 吉之助
  • 蛍光X線分析法による薄膜材料の新しい分析・評価法
    Type:Review
    by Single Author or Co-authored:Single Author
    Date of Publication:1993
    Name of Publisher/Name of Journal:日本金属学会会報
    Volume/Number,Page:32:180
  • Take-off angle-dependent x-ray fluorescence of thin films at glancing incidence
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1993
    Name of Publisher/Name of Journal:Spectrochim. Acta. B
    Volume/Number,Page:48:1471-1480
    Authors:K. Tsuji and K. Hirokawa
  • Estimation of chemical sputtering rates of carbon in He-H2 glow discharge plasmas by optical emission spectroscopy
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1993
    Name of Publisher/Name of Journal:Jpn. J. Appl. Phys.
    Volume/Number,Page:32:916-920
    Authors:K. Tsuji and K. Hirokawa
  • Studies on carbon deposition in Ar-CH4 plasmas with optical emission spectroscopy and x-ray photoelectron spectroscopy
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1992
    Name of Publisher/Name of Journal:Appl. Surf. Sci.
    Volume/Number,Page:59:31-37
    Authors:K.Tsuji and K. Hirokawa
  • Studies on chemical sputtering of Si and C in Ar-H2 glow discharge plasma by optical emission spectroscopy
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1991
    Name of Publisher/Name of Journal:Thin Solid Films
    Volume/Number,Page:205:6-12
    Authors:K. Tsuji and K. Hirokawa
  • グロー放電成膜現象の発光スペクトルによる評価
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1991
    Name of Publisher/Name of Journal:日本化学会誌
    Volume/Number,Page:1991:1379-1385
    Authors:辻 幸一、広川 吉之助
  • Depth profiling studies of oxidized alloy surfaces by glow discharge emission spectroscopy
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1990
    Name of Publisher/Name of Journal:Surf. Interface. Anal.
    Volume/Number,Page:15:223-228
    Authors:K. Tsuji and K. Hirokawa
  • Experimental parameters for XRF analysis of soils
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2010
    Name of Publisher/Name of Journal:Advances in X-ray Analysis
    Volume/Number,Page:53:248-255
    Authors:Y. Imanishi, A. Bando, S. Komatani, S. Wada, K. Tsuji
  • 共焦点型3D蛍光X線分析装置による実験室での3D元素マッピング
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2007
    Name of Publisher/Name of Journal:まてりあ
    Volume/Number,Page:46(12):833
    Authors:辻 幸一、中野 和彦
  • 玩具の表面から溶出する微量な重金属をモニターする
    by Single Author or Co-authored:Co-authored
    Date of Publication:2009
    Name of Publisher/Name of Journal:第70回分析化学討論会 展望とトピックス
    Volume/Number,Page::8
    Authors:川又 誠也、中野 和彦、辻 幸一
  • 分析装置の解体
    by Single Author or Co-authored:Single Author
    Date of Publication:2007
    Name of Publisher/Name of Journal:日産アークMONTHLY
    Volume/Number,Page:16(10):3
  • コメ一粒における3次元の元素分布を可視化する
    by Single Author or Co-authored:Co-authored
    Date of Publication:2006
    Name of Publisher/Name of Journal:第67回分析化学討論会、展望とトピックス
    Volume/Number,Page::23
    Authors:中野 和彦、 辻 幸一
  • Spring8 User Experiment Report
    by Single Author or Co-authored:Co-authored
    Date of Publication:2003
    Name of Publisher/Name of Journal:Spring8 User Experiment Report
    Volume/Number,Page:11(2003A):179
    Authors:K. Tsuji, S. Hayakawa, T. Hari, K. Yamane, N. Kometani, Y. Yonezawa
  • Micro-XRF Instrument Developedin Combination with Atomic Force Microscope
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2005
    Name of Publisher/Name of Journal:Advances in X-Ray Analysis
    Volume/Number,Page:48:221-228
    Authors:K. Tsuji, T. Emoto, Y. Matsuoka, Y. Miyatake, T. Nagamura, and X. Ding
  • 斜出射X線分析のEPMAへの応用
    Type:Commentary
    by Single Author or Co-authored:Single Author
    Date of Publication:2002
    Name of Publisher/Name of Journal:日本電子(株)EPMA・表面分析ユーザーズミーティング解説書
    Volume/Number,Page:2002
  • Characterization of thin-films at small region by grazing-exit electron probe microanalysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:Mater. Trans. JIM.
    Volume/Number,Page:43:414-416
    Authors:K. Tsuji, Z. Spolnik, K. Wagatsuma, K. Saito, K. Asami
  • Material analysis methods applied to the study of ancient monuments, works of art and artefacts
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2002
    Name of Publisher/Name of Journal:Mater. Trans.
    Volume/Number,Page:43:2197-2200
    Authors:F. Delalieux, K. Tsuji, K. Wagatsuma, R. Van Grieken
  • Detection limit of grazing-exit electron probe microanalysis (GE-EPMA) for particles analysis
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:2000
    Name of Publisher/Name of Journal:Mikrochim. Acta
    Volume/Number,Page:132:357-360
    Authors:K. Tsuji, Z. Spolnik, K. Wagatsuma, R. Nullens, and R. Van Grieken
  • Conversion ofsputtering time into depth in depth profiles of oxidized Cu-Ni alloys obtained by glow discharge spectroscopy
    Type:Paper
    by Single Author or Co-authored:Co-authored
    Date of Publication:1991
    Name of Publisher/Name of Journal:Surf. Interface. Anal.
    Volume/Number,Page:17:819-822
    Authors:K. Tsuji and K. Hirokawa

Academic Society Activities

Conference Presentations

  • (Invited) Kouichi Tsuji, Shota Aida, Yuki Takimoto, XRF imaging based on polycapillary optics
    Date:2016/09
    Conference Name:The 7th International Conference Channeling 2016 - Charged & Neutral Particles Channeling Phenomena
    Domestic or Foreign:Italy
  • K. Tsuji, Workshop Instructor on “ Trace Analysis”
    Date:2016/08
    Conference Name:65th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, Y. Takimoto, M. Yamanashi, S. Kato, T. Yamada, T. Shoji, N. Kawahara, Comparison of Wavelength-Dispersive and Energy-Dispersive XRF Imaging Methods (oral).
    Date:2016/08
    Conference Name:65th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • N. Kawahara, T. Matsuno, K. Tsuji, Calculation of Fluorescent X-ray Intensity for Confocal Micro-XRF Analysis of Inhomogeneous Samples (poster).
    Date:2016/08
    Conference Name:65th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • Laura Borgese, Fabjola Bilo, Annalisa Zacco, Diane Eichert, Werner Jark, Kouichi Tsuji, Elza Bontempi and Laura Eleonora Depero, Chemical analysis of airborne particulate matter collected on filters prepared by SMART STORE™ by means of X-Ray Fluorescence based techniques (oral).
    Date:2016/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2016)
    Domestic or Foreign:Sweden
  • Ryohei Hosomi, Yuri Tabuchi and Kouichi Tsuji, Sample preparation for TXRF analysis of teas (oral).
    Date:2016/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2016)
  • Shota Aida, Masaki Yamanashi, Yuki Takimoto, Yuta Kitado, Francesco Paolo Romano, Koen Janssens and Kouichi Tsuji, WD- and ED-XRF imaging techniques for industrial and painting samples(poster).
    Date:2016/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2016)
    Domestic or Foreign:Sweden
  • Ryohei Hosomi and Kouichi Tsuji, Sample preparation for TXRF analysis of metal particles in used machine oil (poster).
    Date:2016/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2016)
    Domestic or Foreign:Sweden
  • Shota Aida, Takeshi Hasegawa and Kouichi Tsuji, Preliminary research on PCA for micro XRF imaging (poster).
    Date:2016/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2016),
    Domestic or Foreign:Sweden
  • Kouichi Tsuji, Yuki Takimoto, Tsuyoshi Matsuno, Naoki Kawahara and Jigi Chin, Confocal micro-XRF imaging and WD- XRF imaging for monitoring of chemical reactions in solutions (oral).
    Date:2016/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2016)
    Domestic or Foreign:Sweden
  • (invited)K. Tsuji, ED and WD XRF imaging
    Date:2015/09
    Conference Name:Chinese conference of X-ray Spectrometry, 17-18 September 2015, Weihai, China.
    Domestic or Foreign:China
  • (invited)K. Tsuji, XRF imaging –scanning & projection techniques-
    Date:2015/09
    Conference Name:Chinese conference of X-ray Spectrometry: Workshop at National Research Center of Geoanalysis, 15-16 September 2015, Beijing, China.
    Domestic or Foreign:China
  • (invited)K. Tsuji, TXRF standardization
    Date:2015/09
    Conference Name: Chinese conference of X-ray Spectrometry: Workshop at National Research Center of Geoanalysis, 15-16 September 2015, Beijing, China.
    Domestic or Foreign:China
  • J. Chin and K. Tsuji, Confocal micro XRF analysis for monitoring corrosion of steel sheet in the solution (oral).
    Date:2015/09
    Conference Name:Chinese conference of X-ray Spectrometry, 17-18 September 2015, Weihai, China
    Domestic or Foreign:China
  • Yuki Takimoto, Masaki Yamanashi, Shuichi Kato, Takashi Shoji, Kouichi Tsuji, Fast elemental imaging by WD-XRF spectrometer (poster).
    Date:2015/09
    Conference Name:RSC Tokyo International Conference 2015, International Conference Session, JASIS Conference, 3-4 September 2017, Makuhari Messe International Conference Hall, Chiba, Japan
    Domestic or Foreign:Japan
  • Shota Aida, Tsuyoshi Matsuno, Takeshi Hasegawa, Kouichi Tsuji, Application of PCA for X-ray Fluorescence Mapping (poster).
    Date:2015/09
    Conference Name:RSC Tokyo International Conference 2015, International Conference Session, JASIS Conference, 3-4 September 2016, Makuhari Messe International Conference Hall, Chiba, Japan
    Domestic or Foreign:Japan
  • Ryohei Hosomi, Yuri Tabuchi, Kouichi Tsuji, Total Reflection X-ray Fluorescence Analysis of Metal Particles in Used Machine Oil (poster).
    Date:2015/09
    Conference Name:RSC Tokyo International Conference 2015, International Conference Session, JASIS Conference, 3-4 September 2015, Makuhari Messe International Conference Hall, Chiba, Japan
    Domestic or Foreign:Japan
  • Date:2015/08
    Domestic or Foreign:USA
  • Date:2015/08
    Domestic or Foreign:USA
  • Date:2015/08
    Domestic or Foreign:USA
  • Date:2015/08
    Domestic or Foreign:USA
  • Date:2015/08
    Domestic or Foreign:USA
  • Date:2015/08
    Domestic or Foreign:USA
  • Date:2015/08
    Domestic or Foreign:USA
  • Date:2015/04
    Conference Name:Technart2015, 27-30 April 2015, Catania, Italy
    Domestic or Foreign:Italy
  • Date:2014/10
    Conference Name:he 6th International Conference Channeling 2014 - Charged & Neutral Particles Channeling Phenomena, 5-10 October 2014, Capri (NA), Italy
    Domestic or Foreign:Italy
  • Date:2014/10
    Conference Name:The 6th International Conference Channeling 2014 - Charged & Neutral Particles Channeling Phenomena, 5-10 October 2014
    Domestic or Foreign:Italy
  • (invited) K. Tsuji, Scanning and Projection type XRF Imaging
    Date:2014/11
    Conference Name:SARX2014 Latin American Seminar of Analysis by X-Ray Techniques, 3-7 November 2014, Carlos Paz, Córdoba, Argentina.
  • (invited)K. Tsuji, Workshop-organizer and instructor on “XRF imaging”
    Date:2014/07
    Conference Name:63rd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • (invited) K. Tsuji, Workshop-instructor on “Trace Analysis”
    Date:2014/07
    Conference Name:63rd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, M. Yamanashi, S. Kato, T. Yamada, and T. Shoji, Wavelength dispersive XRF imaging spectrometer using polycapillary angular filter and 3D X-ray detector(oral).
    Date:2014/07
    Conference Name:63rd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, Y. Tabuchi, Y. Shimizu, and T. Yamada, TXRF analysis of halogen in Japanese soy sauce and other liquid samples (oral).
    Date:2014/07
    Conference Name:63rd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • Date:2014/06
    Conference Name:38th International Symposium on Environmental Analytical Chemistry (ISEAC38)
  • Date:2014/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
  • Date:2014/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
  • Date:2014/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
  • Date:2014/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
  • Date:2014/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
  • Rogerta Dalipi, Laura Borgese, Andrea Casaroli, Marco Boniardi, Ursula Fittschen, Kouichi Tsuji, and Laura E. Depero, A TXRF study of metal release from AISI 304 in simulated food contact
    Date:2014/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
  • Padilla-Alvarez R., Karydas A.G., Migliori A., Diawara Y., Kouichi Tsuji, Borgese L., Depero L. E., Proficiency test in TXRF water analysis
    Date:2014/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2014), 15-20 June 2014, Bologna, Italy.
  • Shintaro Komatani, Aoyama Tomoki, and Kouichi Tsuji,3DXRF analysis of industrial device in comparison with SEM-EDS and conventional micro- (poster).
    Date:2013/09
    Conference Name:15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis
    Domestic or Foreign:Japan
  • Takafumi Ashida, Tsuyoshi Sawamura, and Kouichi Tsuji, Development of a compact GE-XRF spectrometer for fast trace elemental analysis (poster)
    Date:2013/09
    Conference Name:15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis
    Domestic or Foreign:Japan
  • Shintaro Hirano, Yuta Kitado, Koji Akioka, Takashi Doi, Masahiro Arai, Kouichi and Tsuji, In situ 3DXRF monitoring of metal-corrosion and deposition processes near liquid/solid interface (poster).
    Date:2013/09
    Conference Name:15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis
    Domestic or Foreign:Japan
  • Ryota Yagi, Jigi Chin, Koji Akioka, Masahiro Arai, Takashi Doi, Kouichi Tsuji, 3DXRF analysis for observing corrosion process of painted coating layer on steel samples (poster)
    Date:2013/09
    Conference Name:15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis
    Domestic or Foreign:Japan
  • Yuri Tabuchi, Sho Kaku, and Kouichi Tsuji TXRF analysis of halogen in environmental and biological samples (poster)
    Date:2013/09
    Conference Name:15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis
    Domestic or Foreign:Japan
  • Seiji Emoto, Masaki Yamanashi, Takashi Shouji, Shuichi Kato, Takashi Yamada, and Kouichi Tsuji, Analytical characteristics of wavelength dispersive XRF imaging with polycapillary optics and 2D detector (poster).
    Date:2013/09
    Conference Name:15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013), and the 49th Annual Conference on X-Ray Chemical Analysis
    Domestic or Foreign:Japan
  • S. Smolek, T. Nakazawa, K. Nakano, K. Tsuji, C. Streli, P. Wobrauschek, Forensic Investigations with Different Confocal Micro-XRF Spectrometers (poster).
    Date:2013/08
    Conference Name:62nd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Akioka, T. Doi, M. Arai, T. Nakazawa, K. Tsuji, Under Film Corrosion Process of Steel Sheets Observed by Confocal Micro XRF Technique (poster)
    Date:2013/08
    Conference Name:62nd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • T. Ohmori, S. Emoto, S. Kato, M. Doi, T. Shoji, and K. Tsuji, Fast Elemental Imaging by Wavelength Dispersive X-ray Fluorescence Imaging Spectrometer (poster)
    Date:2013/08
    Conference Name:62nd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • Workshop-instructor on “Trace Analysis” Instructor
    Date:2013/08
    Conference Name:62nd Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, T. Nakazawa, K. Akioka, T. Doi, M. Arai, Development of a vacuum confocal micro-XRF instrument and 3D-XRF analysis of layered materials (invited)
    Date:2012/11
    Conference Name:International symposium on "Recent advance in analytical techniques for steelmaking industry" (RATEC2012)
    Domestic or Foreign:Japan
  • K. Tsuji, T. Ohmori, T. Nakazawa, X-ray elemental imaging with scanning and projection modes in the laboratory (invited)
    Date:2012/09
    Conference Name:"Channeling 2012" 5th International Conference Charged and Neutral Particles Channeling Phenomena
    Domestic or Foreign:Italy
  • K. Tsuji, Workshop “Trace/TXRF Analysis” Instructor
    Date:2012/08
    Conference Name:61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, S. Kaku, T. Ohmori, T. Yoshioka, TXRF Analysis of Environmental and Biological Samples (invited)
    Date:2012/08
    Conference Name:61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, T. Nakazawa, Development of a Vacuum Confocal Micro-XRF Instrument and Its Applications (invited)
    Date:2012/08
    Conference Name:61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, A. Tabe, T. Nakazawa, T. Awane, X-Ray Micro Analysis of Environmental and Painting Samples(invited)
    Date:2012/05
    Conference Name:in the special session “Prof. Rene Van Grieken: 40 years of international environmental chemistry” at the 37th edition of the International Symposium on Environmental Analytical Chemistry (ISEAC-37)
    Domestic or Foreign:Belgium.
  • H. Oka, T. Sawamura, K. Tsuji, Development of a portable grazing-exit XRF analyzer (poster)
    Date:2012/11
    Conference Name:International symposium on "Recent advance in analytical techniques for steelmaking industry" (RATEC2012)
    Domestic or Foreign:Japan
  • F. Onoue, T. Nakamura, K. Tsuji, Elemental X-ray imaging combined with glow discharge sputtering (poster).
    Date:2012/11
    Conference Name:International symposium on "Recent advance in analytical techniques for steelmaking industry" (RATEC2012)
    Domestic or Foreign:Japan
  • M. A. Malek, T. Nakazawa, H.-W. Kang, K. Tsuji, C.-U. Ro, Characterization of layered materials related to forensic investigation by confocal micro-X-ray fluorescence and attenuated total reflectance FT-IR imaging (poster)
    Date:2012/08
    Conference Name:2012 Asia-Pacific Winter Conference on Plasma Spectrochemistry (2012APWC)
    Domestic or Foreign:Korea
  • S. Emoto, K. Tsuji, Depth elemental imaging of near surface of the forensic samples by confocal 3D-XRF (poster).
    Date:2012/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2012)
    Domestic or Foreign:Austria
  • T. Ashida, T. Ohmori, K. Tsuji, X-ray elemental imaging by using two dimensional X-ray detector (poster)
    Date:2012/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2012)
    Domestic or Foreign:Austria
  • S. Hirano, S. Komatani, K. Tsuji, Micro X-ray beam produced with a single glass capillary and a metal small ball for XRF analysis (poster).
    Date:2012/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2012)
    Domestic or Foreign:Austria
  • T. Nakazawa, M. A. Malek, H. -W. Kang, K. Tsuji, C. -U. Ro, Characterization of Layered Materials by Confocal Micro-XRF and ATR-FT-IR Imaging Techniques (poster).
    Date:2012/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2012)
    Domestic or Foreign:Austria
  • T. Nakazawa, A. Tabe, S. Smolek, C. Streli, P. Wobrauschek, K Tsuji, Evaluation of analytical performance of confocal micro-XRF spectrometers (oral)
    Date:2012/06
    Conference Name:European Conference on X-Ray Spectrometry (EXRS2012)
    Domestic or Foreign:Austria
  • K. Nakano, S. Emoto, T. Nakazawa, K. Otsuki, K. Tsuji, Depth Elemental Imaging of Forensic Samples by Confocal Micro XRF Method (poster)
    Date:2012/08
    Conference Name:61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • S. Komatani, S. Hirano, T. Aoyama, Y. Yokota, H. Ueda, K. Tsuji, Micro X-Ray Beam Produced with a Single Glass Capillary for XRF Analysis (poster)
    Date:2012/08
    Conference Name:61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • T. Nakazawa, M. A. Malek, H.-W. Kang, C.-U. Ro, K. Tsuji, Characterization of Layerd Materials Related to Forensic Investigation by Confocal Micro-XRF and ATR-FT-IR Imaging Techniques (poster)
    Date:2012/08
    Conference Name:61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • S. Hirano, T. Yoshioka, A. Tabe, T. Nakazawa, K. Tsuji, Application of Confocal Micro-XRF to Solid-Liquid Interface Analysis and Ancient Chinese Ceramics (poster).
    Date:2012/08
    Conference Name:61st Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • Date:2011/10
    Domestic or Foreign:Domestic
  • Date:2011/10
    Domestic or Foreign:Domestic
  • Date:2011/06
    Domestic or Foreign:Domestic
  • Date:2011/11
    Domestic or Foreign:Domestic
  • Date:2012/04
    Domestic or Foreign:Domestic
  • K. Tsuji, X-ray elemental imaging in the laboratory - Research activity at OCU (Osaka City University) -(invited)
    Date:2012/03
    Conference Name:LNF Seminar
    Domestic or Foreign:Italy
  • K. Tsuji, GD-SEM observation and 3D-XRF analysis of industrial materials(invited)
    Date:2012/02
    Conference Name:Inha University Seminar
    Domestic or Foreign:Korea
  • K. Tsuji, A few approaches for elemental imaging at OCU (Osaka City University)(invited)
    Date:2012/01
    Conference Name:TU Wien Seminar
    Domestic or Foreign:Austria
  • K. Tsuji, T. Nakazawa, 3D-XRF Analysis for Industrial Samples and Projection TypeXRF Imaging,(invited)
    Date:2011/11
    Conference Name:The Seminar on Characterization of Advanced Inorganic Materials with Different Methods,Shanghai Institute of Ceramics
    Domestic or Foreign:China
  • T. Nakazawa, K. Tsuji, Enhancement of XRF intensity using total reflection in Au-coated capillary optics (poster).
    Date:2011/06
    Conference Name:TXRF2011
    Domestic or Foreign:Germany
  • T. Yoshioka, Y.Imanishi, K. Tsuji, Y. Shimizu, T. Yamada, H. Takabe, T. Doi, K. Akioka, M. Arai, Sample preparation of sea water for TXRF analysis (poster)
    Date:2011/06
    Conference Name:TXRF2011
    Domestic or Foreign:Germany
  • T. Nakazawa, A. Tabe, K. Nakano, K. Tsuji, Micro-XRF Analysis in Helium Atmosphere (poster)
    Date:2011/05
    Conference Name:ICASS2011
    Domestic or Foreign:Japan
  • T. Nakazawa, K. Nakano, K. Tsuji, Chemical Depth Imaging by Confocal micro-XRF (invited)
    Date:2011/10
    Conference Name:FACSS2011
    Domestic or Foreign:USA
  • K. Tsuji, C. Nishi, T. Nakazawa, K. Nakano, K.Otsuki, Y. Nishiwaki, H. Takenaka, 3D-XRF Analysis of Several Forensic and Industrial Samples (invited).
    Date:2011/08
    Conference Name:DXC2011
    Domestic or Foreign:USA
  • K. Tsuji, M. Yamaguchi, T. Ohmori, XRF imaging using total reflection in polycapillary optics and X-ray CCD detector (invited).
    Date:2011/06
    Conference Name:The 14th International Conference on Total Reflection X-ray Fluorescence and Related Methods
    Domestic or Foreign:Germany
  • K. Tsuji, K. Nakano, T. Nakazawa, Development of Confocal 3D-XRF Instrument and Nondestructive Depth Analysis of Forensic Samples, (oral).
    Date:2011/03
    Conference Name:Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy
    Domestic or Foreign:USA
  • K. Tsuji, K. Nakano, Development of Micro and 3D XRF Instrument in the Laboratory, (poster).
    Date:2010/08
    Conference Name:The 10th International Conference on X-ray Microscopy
    Domestic or Foreign:USA
  • T. Nakazawa, K. Nakano, K. Tsuji, Analytical Performance of Newly Developed 2D/3D-XRF Instruments, (poster).
    Date:2010/08
    Conference Name:59th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • Y. Nishida, K. Tsuji, Liquid-Liquid near interface analysis by micro-XRF using injection needle type collimators, (poster).
    Date:2010/06
    Conference Name:European Conference on X-ray Spectrometry
    Domestic or Foreign:Portugal
  • K. Nakano,K. Tsuji, Nondestructive depth profiling of layered materials and 3D-XRF analysis of biological sample, (oral).
    Date:2010/06
    Conference Name:European Conference on X-ray Spectrometry
    Domestic or Foreign:Portugal
  • K. Tsuji, Comparison of analytical performance of 3D-XRF instruments, invited talk.
    Date:2010/09
    Conference Name:China 2010 XRS Conference
    Domestic or Foreign:China
  • K. Tsuji, K. Nakano, C. Nishi, T. Nakazawa, Nondestructive elemental depth profiling by confocal 3D-XRF method in the Laboratory, invited talk.
    Date:2010/09
    Conference Name:Workshop; National Research Center forGeoanalysis
    Domestic or Foreign:China
  • K. Tsuji, Workshop “Standards and Advanced Sample Preparation for XRF Analysis” Organizer,
    Date:2010/08
    Conference Name:59th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K.Tsuji, X-ray Chemical Imaging in Scanning and Projection modes in the laboratory, invited talk.
    Date:2010/08
    Conference Name:59th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Nakano, M. Kawamata, and K. Tsuji, TXRF Analysis of Multiple Droplet Residues(oral).
    Date:2009/07
    Conference Name:DXC2009
    Domestic or Foreign:USA
  • K. Tsuji, M. Kawamata, and K. Nakano, TXRF AND MICRO-XRF ANALYSIS OF PLASTIC TOYS AND SOILS,(oral).
    Date:2009/07
    Conference Name:58thAnnual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • T.Awane, S. Fukuoka, K. Nakano, K. Tsuji, Grazing Exit Micro XRF Analysis of Harzardous Comtaminations on a Plant Leaf, (poster).
    Date:2009/06
    Conference Name:TXRF2009
    Domestic or Foreign:Sweden
  • K. Tsuji, M. Yamaguchi, and T. Yonehara, X-ray Energy Filtering by Using Total Reflection in Polycapillary X-ray Optics, (oral).
    Date:2009/06
    Conference Name:TXRF2009
    Domestic or Foreign:Sweden
  • K. Tsuji, K. Nakamachi, K. Nakano, Improvement of spatial resolution in 2D and 3D X-ray fluorescence analysis, invited talk,(Keynote lecture)
    Date:2009/08
    Conference Name:36th CSI
    Domestic or Foreign:Hungary
  • T. Awane, S. Fukuoka, and K. Tsuji,Grazing Exit Micro X-ray Fluorescence Analysis of a Hazardous Metal Attached to a Plant Leaf Surface using an X-ray Absorber Method, (poster).
    Date:2009/02
    Conference Name:JST International Symposium on “Micro and Trace X-ray Analysis”
    Domestic or Foreign:Japan
  • Y. Nishida, K. Nakano, and K. Tsuji, Micro XRF analysis in the solutions by using needle-type X-ray collimators, (poster).
    Date:2009/02
    Conference Name:JST International Symposium on“Micro and Trace X-ray Analysis"
    Domestic or Foreign:Japan
  • K. Nakamachi, and K. Tsuji, Micro X-ray beam produced by polycapillary x-ray lens and conical pinholeaperture, (poster).
    Date:2009/02
    Conference Name:JST International Symposium on “Micro and Trace X-ray Analysis"
    Domestic or Foreign:Japan
  • T. Yonehara, and K. Tsuji, X-ray chemical imaging using polycapillary x-ray optics in the laboratory, (poster).
    Date:2009/02
    Conference Name:JST International Symposium on “Micro and Trace X-ray Analysis”
    Domestic or Foreign:Japan
  • S. Fukuoka, K. Nakano, and K. Tsuji, Grazingexit micro XRF analysis of layeredreference materials, (poster).
    Date:2009/02
    Conference Name:JST International Symposium on “Micro and Trace X-ray Analysis"
    Domestic or Foreign:Japan
  • M. Kawamata, and K. Tsuji, Fundamental research on sample preparation for TXRF analysis, (poster).
    Date:2009/02
    Conference Name:JST International Symposium on “Micro and Trace X-ray Analysis"
    Domestic or Foreign:Japan
  • K. Tsuji, T. Yonehara, M. Yamaguchi, and K. Nakano, X-ray chemical imaging with scanning- and projection modes in the laboratory, (oral).
    Date:2009/02
    Conference Name:JST International Symposium on “Micro and Trace X-ray Analysis"
    Domestic or Foreign:Japan
  • K. Nakano, S. Fukuoka, and K. Tsuji, Reference materials (in film) for 3D-XRF analysis, (oral).
    Date:2009/02
    Conference Name:JST International Symposium on “Micro and Trace X-ray Analysis"
    Domestic or Foreign:Japan
  • K. Tsuji, Micro and imaging x-ray analysis by using polycapillary x-ray optics, (oral).
    Date:2008/08
    Conference Name:Part of the SPIE International Symposium on Optical Engineering + Applications
    Domestic or Foreign:USA
  • K. Nakano, K. Tsuji, Preparation of the Multi-Layered Plastic Reference Materials for Confocal 3D-Micro X-ray Fluorescence Analysis, (poster).
    Date:2008/08
    Conference Name:57th Annual Conference on Applications of X-ray AnalysisDenver X-ray Conference
    Domestic or Foreign:USA
  • K. Nakano, K. Okubo, K. Tsuji, Preconcentration of the Environmental water by Agar for X-ray fluorescence, (oral).
    Date:2008/08
    Conference Name:57th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, H. Matsui, M.Hino,H. Wanibuchi, H. Kohno, K. Aranami, Y. Shimizu, T. Yamada, SAMPLE PREPARATION FOR TOTAL-REFLECTION X-RAY FLUORESCENCE ANALYSIS OF BLOOD SAMPLE, (poster).
    Date:2008/08
    Conference Name:57th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, A. Matsuda, K. Nakano, S. Komatani, S. Ohzawa, H. Uchihara, APPLICATIONS OF POLYCAPILLARY OPTICS TO MICRO AND TWO DIMENSIONAL XRF ANALYSIS, (oral).
    Date:2008/08
    Conference Name:57th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, K. Nakano,3D-XRF Analysis of Solutions in Micro Chemical Chip, poster.
    Date:2008/07
    Conference Name:XRM2008 (PSI 9th International Conference on X-Ray Microscopy)
    Domestic or Foreign:Swizerland
  • K. Tsuji and S. Kawamata, Micro TXRF Analyses of Multiple Residues on A Flat Substrate, poster.
    Date:2008/06
    Conference Name:EXRS2008 (European Conference on X-ray Spectrometry)
    Domestic or Foreign:Croatia
  • K. Tsuji, K. Nakano, K. Okubo and Y. Nishida, X-ray Fluorecenece Analysis Using X-ray Transparent Thin Films for Sample Surpport , poster.
    Date:2008/06
    Conference Name:EXRS2008 (European Conference on X-ray Spectrometry)
    Domestic or Foreign:Croatia
  • K. Tsuji and Y. Nishida, X-ray Fluorecenece Analysis of Liquid/Solid Samples, oral.
    Date:2008/06
    Conference Name:EXRS2008 (European Conference on X-ray Spectrometry)
    Domestic or Foreign:CROATIA
  • K. Tsuji, Applications of Glow Discharge Plasma and Micro X-ray Fluorescence Analysis, invited talk.
    Date:2008/11
    Conference Name:The International Expert Meetingon GDS
    Domestic or Foreign:Japan
  • K. Tsuji, M. Yamaguchi, T. Yonehara, Feasibility of X-ray Energy Filtering by using Polycapillary X-ray Optics, invited talk.
    Date:2008/10
    Conference Name:57st Wokshop : “Channeling 2008“ Charged and Neutral Particles Channeling Phenomena
    Domestic or Foreign:Italy
  • K. Tsuji, K. Nakano, Trace and Micro XRF analysis in the Laboratory, invited talk.
    Date:2008/10
    Conference Name:The 7th Chinese X-Ray Spectrometry Conference
    Domestic or Foreign:China
  • Y. Hirose, N. Murata, T. Katayama, K. Tsuji, “Multi-dimension analysis of vias in ULSIs”, oral.
    Date:2007/11
    Conference Name:International Symposium on “Future Prospects of Scanning Electron / He+Ion Microscope for Nano-surface Analysis”-bridging the gap between surface analysis and electron microscopy-
    Domestic or Foreign:Japan
  • K.Tsuji, “Micro and 3D XRF studies in Osaka City University”
    Date:2007/11
    Conference Name:Inha University
    Domestic or Foreign:Korea
  • T. Yonehara, K. Tsuji, “Development of compact XRF probe and solid-liquid interface XRF analysis”, poster.
    Date:2007/11
    Conference Name:The 9th Asian Conference on Analytical Sciences (Asianalysis)
    Domestic or Foreign:Korea
  • A. Matsuda, K. Nakano, K. Tsuji, S. Komatani, S. Ohzawa, H. Uchihara, “FundamentalResearch of New OpticsSystem for micro-X-ray Fluorescence”,poster.
    Date:2007/11
    Conference Name:The 9th Asian Conference on Analytical Sciences (Asianalysis)
    Domestic or Foreign:Korea
  • K. Nakano, K. Tsuji, “Total Reflection X-Ray Fluorescence and Confocal-3D micro X-Ray Fluorescence Analyses for Chemical Microchips”, oral.
    Date:2007/11
    Conference Name:The 9th Asian Conference on Analytical Sciences (Asianalysis)
    Domestic or Foreign:Korea
  • K. Nakano, H. Matsui, K. Matsuda, M. Mizuhira, K. Tsuji, “A Quick Preparation of In-house Reference materials of theFood GrainSample for XRF analysis”, poster.
    Date:2007/11
    Conference Name:The 9th Asian Conference on Analytical Sciences (Asianalysis)
    Domestic or Foreign:Korea
  • S. Fukuoka, K. Tsuji, “Preliminary Experiment of Micro-XRF combined with AFM”, poster.
    Date:2007/09
    Conference Name:19th International Conference on X-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • A. Matsuda, K. Nakano, S. Komatani, S. Ohzawa, H. Uchihara, K. Tsuji, “Fundamental Research of X-ray Focusing Lens”, poster.
    Date:2007/09
    Conference Name:19th International Conference on X-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • Y. Hanaoka, H. Matsui, K. Nakano, K. Tsuji, “Compact TXRF Instrument Developed by Using a SecondaryTarget and a Si Reflector”, poster.
    Date:2007/09
    Conference Name:19th International ConferenceonX-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • T. Yonehara, K. Tsuji, “Development of a CompactXRF Probe with a Ring-type Secondary Target”, poster.
    Date:2007/09
    Conference Name:19th International Conference on X-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • Y. Nishida, T. Yonehara, K. Tsuji, “Solid-Liquid Interface Analysis by Compact XRF Probe”,poster.
    Date:2007/09
    Conference Name:19th International Conference on X-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • H. Matsui, K. Nakano, K. Tsuji, “Comparison ofMicro-TXRF and Micro Grazing-Exit XRF”, poster.
    Date:2007/09
    Conference Name:19th International Conference on X-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • K. Katsui, K. Tsuji, “Time-Resolved XRF Measurement of Living Plants”,poster.
    Date:2007/09
    Conference Name:19th International Conference on X-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • K. Nakano, K. Tsuji, “Development and Application of confocal 3D-micro-XRF spectrometer”,oral.
    Date:2007/09
    Conference Name:19th International Conference on X-Ray Optics and Microanalysis (ICXOM2007)
    Domestic or Foreign:Japan
  • Kazuhiko Nakano, Hiroshi Matsui, Masayuki Hino, Takashi Yamada, Kouichi Tsuji, TXRF analysis of the biological fluid samples using bench-top type TXRF spectrometer, poster.
    Date:2007/06
    Conference Name:TXRF2007
    Domestic or Foreign:Italy
  • K. Tsuji, T. Yonehara, K. Nakano, SOLID-LIQUID INTERFACE ANALYSIS BY LABORATORY-MADE 3D-MICRO-XRF INSTRUMENT, poster.
    Date:2007/05
    Conference Name:EMAS2007 (European Microbeam Analysis Society, 10th EuropeanWorkshop on Modern Developments and Applications in Microbeam Analysis)
    Domestic or Foreign:Belgium
  • K. Tsuji, “Special Configurations in X-ray Fluorescence for Environmental Analysis”, invited talk.
    Date:2007/11
    Conference Name:The 9th Asian Conference on Analytical Sciences (Asianalysis)
    Domestic or Foreign:Korea
  • K. Tsuji, “Research Plan for Development of High Spatial Resolution XRF Instrument”, invited talk.
    Date:2007/09
    Conference Name:ICXOM 2007 Satellite meeting of Micro Area Analysis by X-ray in Laboratory
    Domestic or Foreign:Japan
  • K. Tsuji, “Micro-TXRF analysis with a pinhole aperture”, inveted talk.
    Date:2007/06
    Conference Name:TXRF2007
    Domestic or Foreign:Italy
  • K. Tsuji, “TXRF analysis withchemical microchip and 3D XRFanalysis of solid/liquid interfaces “, invited talk.
    Date:2006/12
    Conference Name:8 December, 2006, Dortmund, Germany
    Domestic or Foreign:Germany
  • A. Von Bohlen, and K. Tsuji, “Improving thedetection limits by TXRF and GEXRF”, invited talk.
    Date:2006/08
    Conference Name:55th Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, “Grazing-Exit and Micro Wavelength-Dispersive X-Ray Spectrometry (GE-WDXRS and m-WDXRS)”,invited talk.
    Date:2006/06
    Conference Name:EXRS 2006
    Domestic or Foreign:France
  • K. Tsuji, K. Nakano, “Nondestructive elemental depth profile of Japanese lacquer Ware “Tamamushi-Nuri”by MicroGE-XRF and Confocal 3D-XRF”, poser.
    Date:2006/12
    Conference Name:Cultural Heritage and Science
    Domestic or Foreign:Belgium
  • K. Tsuji, A. Matsuda, “Micro-XRF Analysis using Needle-Type Collimators”, oral.
    Date:2006/08
    Conference Name:Denver X-ray Conference
    Domestic or Foreign:USA
  • Kazuhiko NAKANO, Kouichi Tsuji, Toshihiro NAKAMURA, Izumi NAKAI, Akira KAWASE, Makoto IMAI, Mikio HASEGAWA, Yohichi ISHIBASHI, “Preparation and certification of the new reference materials; Plastics (disk form, JSAC 0621 – 0625) for determination of Mercury using X-ray fluorescent analysis ”, poster.
    Date:2006/06
    Conference Name:EXRS 2006
    Domestic or Foreign:France
  • Kazuhiko Nakano, Xunliang Ding, Kouichi TSUJI, “Development of Confocal 3D micro XRF Spectrometer with Cr-Mo Dual Excitation”, oral.
    Date:2006/06
    Conference Name:EXRS 2006
    Domestic or Foreign:France
  • Kouichi TSUJI, Keita TANAKA, Yosuke NISHIDA, Kazuhiko NAKANO, Ken-ichi SASAKI, “Micro Total Reflection X-ray Fluorescence (m-TXRF)”, poster.
    Date:2006/06
    Conference Name:EXRS 2006
    Domestic or Foreign:France
  • K. Tsuji, K. Nakano, X. Ding, “Micro X-ray Fluorescence analysis at OCU”,poster.
    Date:2005/10
    Conference Name:6th China XRF International Conference
  • K. Tsuji, K. Nakano, “X-ray Fluorescence analysis of Food Materials”, invited.
    Date:2005/09
    Conference Name:National Research Center of Geoanalysis
  • K. Tsuji,K.Tsutsumimoto, K. Tanaka,K. Nakano, X. Ding, T. Nagamura, Micro-XRF Studies using Polycapillary X-ray Lens and AFM Instrument, invited.
    Date:2005/09
    Conference Name:18th International Conference on X-ray Optics and Microanalysis (ICXOM 2005)
    Domestic or Foreign:Italy
  • K. Tsuji, K. Tanaka, K. Nakano, A. Okhrimovskyy, Y. Konish, X. Ding, “Micro-XRF analysis of biological materials”, invited talk.
    Date:2005/08
    Conference Name:Denver X-ray Conference
    Domestic or Foreign:USA
  • K. Tsuji, T. Emoto, Y. Nishida, K. Tsutsumimoto, K. Nakano, E.Tamaki, Y. Kikutani, A.Hibara and T. Kitamori,,“APPLICATIONS OF X-RAY FLUORESCENCE ANALYSIS FOR CHEMICAL MICROCHIPS”,poster.
    Date:2005/10
    Conference Name:9th International Conferenceon Miniaturized Systems for Chemical and Life Sciences (m-TAS)
    Domestic or Foreign:USA
  • K. Tsuji, K. Tetsuoka, A. Okhrimovskyy, K. Saito, K. Asami, “Lateral Resolution of Electron Probe Microanalysis under Grazing Exit Conditions”,poster.
    Date:2005/09
    Conference Name:18th International Conference on X-ray Opticas and Microanalysis (ICXOM 2005)
    Domestic or Foreign:Italy
  • K. Tsuji, K. Tanaka, Y. Matsuoka, A. Okhrimovskyy, X. Ding, “Applications of Focusing X-ray Optics to TXRF Analysis”,poster.
    Date:2005/09
    Conference Name:18th International Conference on X-ray Optics and Microanalysis (ICXOM 2005)
    Domestic or Foreign:Italy
  • K. Nakano, K. Tanaka, X. Ding, K. Tsuji, “Developmentof a New TXRF Instrument using Polycapillary X-ray Lens”,poster.
    Date:2005/09
    Conference Name:11th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2005)
    Domestic or Foreign:Hundgary
  • A. Okhrimovskyy, K. Tsuji, “Numerical Analysis of X-ray Induced by Electron Beam under Grazing Exit Conditions”, poster.
    Date:2005/09
    Conference Name:11th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2005)
    Domestic or Foreign:Hundgary
  • A.Okhrimovskyy, Y. Matsuoka, K. Saito, K. Tsuji, “Theoretical characterization of reflector-assisted TXRF analysis”,poster
    Date:2005/09
    Conference Name:11th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2005)
    Domestic or Foreign:Hundgary
  • A. Okhrimovskyy, K. Tsuji, “Nondestructive depth profiling with GE-XRF through numerical modeling”, oral.
    Date:2005/09
    Conference Name:11th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2005)
    Domestic or Foreign:Hundgary
  • M. Nakata and K. Tsuji, “STUDY ON CHEMICAL SPUTTERING IN Ar(He)–H2 GASMIXTURES GLOW DISCHERGE PLASMAS BY OPTICAL EMISSION SPECTROSCOPY”, poster.
    Date:2005/09
    Conference Name:Colloquium Spectroscopicum Internationake CSI XXXIV
    Domestic or Foreign:Belgium
  • K.Nakano, H. Matsui, K. Tsutsumimoto, K. Tanaka, T. Nakamura and K. Tsuji, “X-RAY FLUORESCENCE ANALYSIS OF FOOD AND PLASTIC MATERIALS USING CRMS JSAC 0611-0615”, poster.
    Date:2005/09
    Conference Name:Colloquium Spectroscopicum Internationake CSI XXXIV
    Domestic or Foreign:Belgium
  • K Tsuji, A. Matsuda, K. Nakano, A. Okhrimovskyy, “DEPTH UNLIMITED X-RAY FLUORESCENCE ANALYSISFOR SOFT MATERIALS USING NEEDLE-TYPE COLIMATORS”, poster.
    Date:2005/09
    Conference Name:Colloquium Spectroscopicum Internationake CSI XXXIV
    Domestic or Foreign:Belgium
  • K. Tsuji, Y. Nishida, Y. Hanaoka,K. Tsutsumimoto, K. Nakano, E. Tamaki, Y. Kikutani, A. Hibara and T. Kitamori, “X-RAY FLUORESCENCE ANALYSIS FOR CHEMICAL MICROCHIPS”, oral.
    Date:2005/09
    Conference Name:Colloquium Spectroscopicum Internationake CSI XXXIV
    Domestic or Foreign:Belgium
  • K. Nakano, K. Tsuji, T. Nakamura, “Development of Plastic Certified Reference Materials for XRF analysis (JSAC 0611-0615) containing Pb, Cd, Cr”, poster.
    Date:2005/08
    Conference Name:Denver X-ray Conference
    Domestic or Foreign:USA
  • K.Tsuji, T. Emoto, Y. Mtsuoka, Y. Miyatake, T. Nagamura, X Ding,"Combination of scanning probe microscope and x-ray analysis",invited.
    Date:2004/08
    Conference Name:53rd Denver X-Ray Conference
  • K. Tsuji, K. Tetsuoka, T. Nagamura,"Improvement of reproducibility and lateral resolution of elemental analysis in grazing-exit EPMA (GE-EPMA)", poster.
    Date:2004/06
    Conference Name:EXRS (European X-Ray Spectrometry) 2004
  • K. Tsuji, Y. Sato, T. Emoto,"Variation of mapping area and effect of flatness of sample surface in grazing-exit m-XRF (GE-m-XRF) analysis",oral.
    Date:2004/06
    Conference Name:EXRS (European X-Ray Spectrometry) 2004
  • poster: K. Tetsuoka and K. Tsuji, “Improvement of lateralresolution of EPMA by applying grazing-exit X-ray measurements”
    Date:2003/10
    Conference Name:4th International Symposium on Atomic Level Characterizations for New Materials and Devices
    Domestic or Foreign:USA
  • poster: Y. Matsuoka, M. Nakata,K. Tsuji “Development of directly sampling method of solid materials for total-reflection x-ray fluorescence”
    Date:2003/09
    Conference Name:TXRF2003
    Domestic or Foreign:Japan
  • poster: Emoto, Y. Sato, K. Tsuji, Xunliang Ding “Development of micro X-ray fluorescence analysis instrument using polycapillary X-ray lens and its application”
    Date:2003/09
    Domestic or Foreign:Japan
  • Date:2003/09
    Domestic or Foreign:Japan
  • Date:2003/09
    Domestic or Foreign:Japan

Industrial-Academic-Government Cooperation

Research Department

  • Graduate School of Engineering Applied Chemistry and Bioengineering (Applied Chemistry and Bioengineering)

Current Research Subjects

  • Research Subject:micro-trace analysis using electrons and x-rays
    Research Field:Industrial Analytical Chemistry、Surface Physics、Separation, Refining and Identification
    Keywords:total reflection XRF、3 dimensional elementanalysis、environmental analysis
  • Research Subject:Spectroscopic analysis of glow discharge plasmas
    Research Field:Industrial Analytical Chemistry、Industrial Physical Chemistry
    Keywords:glow discharge、plasma process、optical emission spectroscopy
  • Research Subject:Analytical applications of scanning probe microscope
    Research Field:Surface Physics、Industrial Analytical Chemistry
    Keywords:scanning probe microscope、micro analysis、surface science

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